High energy photons emitted by a X-ray tube interact with metal & materials. The high energy photon is absorbed by an electron
of the atom. This electron is accelerated and forced to leave the atom. The so created hole in the structure of the electron shell is filled up by an electron of higher energy. The difference is energy between the leaving electrons position and the filling up electron
may leave the atom as a photon of defined energy or as an electron. In the case of a leaving photon this process is called X-ray fluorescent and the energy of the leaving photon is characteristic for this atom therefore for the element. The electron shells of an atom are called K-, L-, M-shell. Filling up a hole in the K-shell creates, K-radiation (Ka if the filling up electron has is origin in the L-shell, Ka if the filling up electron has is origin in the M-shell). Filling up a hole in the L-shell creates L-radiation and so on. Only K and L radiation is on interest because the energy of K and L radiation is in the region which can be detected with standard detectors.
Propartional Counter Detector
Based on gas filled prop counter formeasuring most common alloys including gold for jewellery industry.
Gas filled Proportional counter has distinct advantages like high efficiency, wide bandwidth larger area where it can be scaled to almost arbitrarily large size.
Silicon Detector (Si-PIN)
Based on high resolution Si-PIN is used for alloys analyzing in jewellery industry including gold & silver, even one step ahead for accuracy & repeatability compare to Gas filled pro counter.
Si-PIN with the usage of a highresolution s i l icon detector in conjunction digital signal processing achieves best detection limits and highest precision. Based on that, an about four times better resolution (in compar i son wi th conventional technique) the element separation is much better.
Furthermore lowest detection limits are achieved because of better signal to noise ratio. The Si-PIN is available with a larger active area and thicker depletion depth. Where resolution is not critical but high detection efficiency is important, the-Si-PIN is the best choice.
Silicon Drift Detector (SDD)
Based on high resolution SDD which is
ultimate for alloys analysing industry it's high resolution helps better repeatability and accuracy of measurement.
SDD has better energy resolution than a Si-PIN of the same area. The SDD has much better energy resolution at short peaking times, which is particularly helpful at high count rates. At the noise corner (the peaking time where the noise is minimal) the SDD's resolution is still better. So where the highest resolution is needed, or where good
resolution is needed at high count rates, the SDD is the choice.
Measurement performance features
automatic application, recognition. application & standards library. numerical filtering package with peak deconvolution.
Chamber performance capability.
Compact Sample Chamber accommodates a wide variety of parts.
This machine are very user friendly& easy to operate doesn't require special person to operate, Simply position the
piece of interest with the aid of a video microscope and start the measurement. The analysis is performed noncontact and non-destructive within 35 sec. to 3 minutes.
Specially useful for plating & electronic industry.
It is very Small in size, thanks to smart design which enables this machine fit at any place from smallest showroom to busy business area.
Ultra fast detection system for quick results where the analysis performed is quick within 60 seconds.
This system is based on X-ray fluorescent radiation technology with modern user friendly software which ensure
The analysis performed non-contect and non - destructive. It also gives you measurement of other sub alloy apart
from main alloy.
Major benefits of XRF with StaRk Series
|Linearity Graph||Reading Window|
|Result Window||Metal Graph|
Features of XMasteR Application
X-MasteR is the user-friendly operating software for the modern suit of X-ray systems. This program used most modern software tools available for Windows® operating platforms. The main task of the operating software is the control of all system parameters such as high voltage settings, X-ray tube current, display of collimators and filters as well as the collection and manipulation of the measurement data.
|Model||StaRk||Stark (Si-Pin)||Stark SDD|
|Measuring Direction||Mini-focus, high performance, W-target Spot 0.2mm-0.8mm||Long life, high efficiency tungsten target, air cooled optional motorised|
|Applied Application||50kV (1.2mA) Current Software Control Optimized|
|X-ray Tube||High Resolution gas filled prop-counter||High resolution silicon detector in conjunction with digital signal processing.Pin Diode, 25mm² with Digital Pulse Processor||Silicon Drift Detector|
|Collimator||0.3mmØ or 0.5mmØ, Optional four positions Collimator changer|
|Inside Chamber||H 35cm, B 40cm, D 31cm,|
|Sample stage||Manual scissors type z-stage. Optional motorized z-stage with Auto focus facility|
|Dimension||400 x 600 x 350mm (WxDxH)|